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3D IC

3D IC

著者： Siemens Digital Industries Software
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 Three-dimensional integrated circuits take less space and deliver higher performance.Siemens Digital Industries Software 政治・政府
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  • The Future of 3D ICs: How Advanced Packaging is Changing the Industry

    The Future of 3D ICs: How Advanced Packaging is Changing the Industry
    2025/05/15
    How are 3D Integrated Circuits (3D ICs) revolutionizing semiconductor design, and what role do advanced packaging technologies play in this transformation? In this episode of the Siemens EDA Podcast Series on 3D IC chiplet ecosystems , host John McMillan sits down with Jan Vardaman, President and Founder of TechSearch International, to discuss the latest advancements in 3D IC technology, heterogeneous integration, and advanced semiconductor packaging. Jan shares insights on why 3D ICs are gaining traction, the key industry drivers behind their adoption, and how companies are overcoming integration challenges. She also explores the role of chiplets, AI-driven design processes, and supply chain shifts in shaping the future of semiconductor manufacturing. Whether you're a semiconductor engineer, a tech enthusiast, or a business leader looking to stay ahead in the industry, this episode is packed with valuable insights into the next generation of IC design. What You’ll Learn in this Episode: The main drivers for advanced integration ( heterogeneous or homogeneous silicon) from a technology and business point of view. (02:10) Specific market segments and industries that are driving these advanced integrations, including chiplet designs ( 3:10 ) The different needs and requirements for packaging ( 6:50 ) How different substrate materials (silicon, RDL, glass core, organic interposer bridges, etc.) compete and complement each other in specific applications ( 8:20 ) Siemens’ Innovator3D IC Platform (10:55) Connect with John McMillan LinkedIn Website Connect with Jan Vardaman LinkedIn Website
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    12 分
  • Uncovering 2.5D and 3D IC Tests

    Uncovering 2.5D and 3D IC Tests
    2023/02/13
    One of the best ways to speed-up product development is to integrate test as early as possible in the design cycle. This shift-left strategy becomes even more critical when advanced IC designs evolve from a single die per package to complex systems with multiple dies integrated into a package. These 2.5D and 3D multi-die design strategies pose some interesting challenges and opportunities for test. Today, David Lyell interviews Joe Reynick, the Tessent Product Engineering Manager for Siemens EDA. He’ll help us to understand the complexity of development tests for 3D and 2.5D packages. In this episode, you’ll learn about the challenges of performing comprehensive tests on 3D and 2.5D designs. You’ll also hear about the factors that you need to consider while planning for 3D DFT and IP tests. Additionally, you’ll hear about how 2.5D tests and 3D tests can complement each other. What You Will Learn In This Episode: The things you need to be aware of when doing 2.5D and 3D tests (03:34) The DFT and IP test methods that the DFT and IP test team should implement (09:36) The die and package level planning interactions needed for 3D DFT and IP test (11:22) Factors to consider while doing 3D tests (14:20) What is involved in multi-die IP core test (16:00) Connect with Joe Reynick:  LinkedIn Connect with David Lyell:  LinkedIn Hosted on Acast. See acast.com/privacy for more information.
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    21 分
  • Getting Started with 3D IC

    Getting Started with 3D IC
    2022/11/08
    3D IC designs are complex puzzles that engineers have to solve to achieve high performance and reliability. While vertical stacking gives more design options, it also increases the possible number of defective arrangements. There is no one-design-fits-all in 3D IC; engineers must understand their needs and create designs that meet them. Today, John McMillan interviews John Ferguson, Product Management Director of Calibre DRC Technologies at Siemens Digital EDA. He’ll help us understand the complexity of 3D IC designs and how it impacts their reliability. In this episode, you’ll learn about some of the guardrails that increase the reliability of 3D IC devices. You’ll also hear about some of the common challenges an engineer has to solve while designing such devices. Additionally, you’ll get some tips on where to start with 3D IC designs to minimize cost and maximize performance. What You Will Learn in this Episode: Improving the reliability of heterogeneous assemblies (01:36) Solving the heat problem in heterogeneous assemblies (07:46) The sources of mechanical stress in 3D IC assemblies and how to address them (14:44) Where to start when designing 3D IC devices (22:07) Connect with John Ferguson:  LinkedIn Connect with John McMillan:  LinkedIn Hosted on Acast. See acast.com/privacy for more information.
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    27 分

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